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Chapter 1 MIO and AI Devices
DAQ Hardware Overview Guide 1-6 www.ni.com
•A conversion signal initiates individual analog-to-digital (A/D)
conversions. This signal can be supplied from the onboard
programmable sample timer, externally through a selected
I/O connector pin, through a RTSI bus trigger line, or by software.
•A stop trigger is a signal used for pretriggered data acquisition to
notify your device to stop acquiring data after a specified number of
scans. Data acquisition operation is continuously performed until the
device receives this signal. This signal can be supplied externally
through a selected I/O connector pin, through a RTSI bus trigger line,
or by software.
•A gate is a signal used for gating the data acquisition. When you enable
gating, the data acquisition will proceed only on selected level of the
gate signal. This signal can be supplied externally through a selected
I/O connector pin, through a RTSI bus trigger line.
•A scan timer timebase is a signal used by the scan timer for scan
interval timing. This signal is used only when the scan timer is used.
This signal can be supplied from one of the onboard timebase sources,
externally through a selected I/O connector pin, or through a RTSI bus
trigger line.
•A sample-interval timer timebase is a signal used by the sample
interval timer for conversion timing. This signal is used only when the
sample interval timer is used. This signal can be supplied from one of
the onboard timebase sources, externally through a selected I/O
connector pin, or through a RTSI bus trigger line.
See your DAQ device user manual for more information regarding these
signals.
DAQ devices with the DAQ-STC use two counters, the scan interval
counter and the sample interval counter. The E Series devices support both
internal and external timebases. The internal timebases available on the
DAQ-STC are 20 MHz (50 ns) and 100 kHz (10 µs). The scan interval
counter is a 24-bit counter, and the sample interval counter is a 16-bit
counter.
While the scan interval counter has the freedom to work with both internal
and external timebases, the sample interval counter can use either the
20 MHz timebase or the timebase used by the scan interval counter.
When you specify a timebase value different from the internal timebases
the DAQ-STC uses, NI-DAQ tries to convert the timebase and interval
values you specified into those that the DAQ-STC can use. If NI-DAQ
cannot make the translation without a loss of resolution, it returns
- DAQ Hardware Overview 1
- Important Information 3
- Chapter 14 7
- SCXI Hardware 7
- Glossary 10
- Contents 11
- About This Guide 12
- MIO and AI Device Terminology 15
- Table 1 16
- Related Documentation 17
- MIO and AI Devices 18
- Chapter 1 MIO and AI Devices 19
- E Series Data Acquisition 20
- Set_DAQ_Device_Info 22
- MIO Device Analog Output 24
- E Series Digital I/O 26
- E Series PFI Pins 27
- Lab and 1200 Devices 28
- AI_Trigger_Config.vi 31
- DAQ_StopTrigger_Config 31
- Table 2-2 32
- Lab and 1200 Devices Groups 33
- Figure 2-1 34
- 1200 Device Acquisition Rate 35
- 1200 Device Calibration 36
- LPM Devices 37
- DAQ_Config 38
- LPM Device Digital I/O 39
- LPM Device Counter/Timers 40
- 516 Devices and 41
- DAQCard-500/700 Devices 41
- DAQ_Config. If you do 43
- Counter/Timer Operation 44
- Figure 4-2 45
- AT-AO-6/10 Analog 46
- Output Devices 46
- AT-AO-6/10 Digital I/O 48
- 6703/6704 Devices 49
- PC-TIO-10 Timing I/O Device 50
- PC-TIO-10 Counter/Timers 54
- PC-TIO-10 Digital I/O 55
- DIO-96 Digital I/O Devices 56
- DIO-96 Groups 57
- DIO-24 (6503) 58
- AT-MIO-16DE-10, and 6025E 58
- DIO-32F and 6533 60
- Digital I/O Devices 60
- Digital_Buffer_Write.vi) 62
- AMUX-64T External 63
- Multiplexer Accessory 63
- Table 11-2 64
- AMUX-64T Channel Numbers 64
- SCAN_Setup or 65
- MIO_Config 67
- Accessories 68
- SC-2042-RTD Accessory 69
- SC-2043-SG Accessory 69
- SCC Series Modules 70
- SCC-CI20 Current Input Module 72
- SCC-LP Lowpass Filter Modules 73
- SCC Configuration 74
- SCXI Operating Modes 76
- Chapter 14 SCXI Hardware 77
- SCXI Data Acquisition Device 80
- SCXI-1200 80
- SCXI Analog Input Modules 81
- SCXI-1100 81
- SCXI-1101 82
- SCXI-1104/C 83
- SCXI-1112 83
- SCXI_Scale function to 84
- SCXI_Single_Chan_Setup 84
- SCXI-1125 85
- SCXI-1122 85
- SCXI-1126 86
- SCXI-1127 87
- SCXI-1140 87
- SCXI Analog Output Module 89
- SCXI-1124 89
- SCXI Digital Modules 90
- SCXI-1160 and SCXI-1161 90
- SCXI-1162 and SCXI-1162HV 91
- SCXI-1163 and SCXI-1163R 91
- SCXI-1530, SCXI-1531 92
- SCXI-1540 92
- SCXI_Track_Hold_Setup 94
- DIO-24 and the DIO-96 96
- DIO-32F and 6533 Device 97
- VXI-DAQ Devices 99
- AO_Change_Parameter or the 100
- Multifunction VXIbus Devices 101
- VXI-DAQ Signal Conditioning 102
- VXI-SC-1102 Submodule 103
- VXI-SC-1150 Submodule 103
- PXI DAQ Devices 104
- PXI DAQ Signal Conditioning 105
- NI 5411 Devices 106
- Chapter 17 NI 5411 Devices 107
- DDS Mode 108
- Table 17-2 110
- NI 5411 Operational Modes 110
- Device Analog Input 112
- Data Acquisition 113
- Acquisition Timing 114
- Current Source 115
- Digital I/O 115
- Device Input 116
- Chapter 19 NI 40XX Devices 118
- DSA Devices 119
- and NI 455 120
- Analog Input Channels 120
- Data Acquisition Timing 121
- Channels 122
- Digital I/O 123
- Counter/Timer Operation 124
- Devices 125
- Chapter 21 671X Devices 126
- Technical Support Resources 129
- Worldwide Support 130
- Numbers/Symbols 131
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