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E Series Multifunction DAQ Overview
233
National Instruments • Tel: (800) 433-3488 Fax: (512) 683-9300 [email protected] ni.com
E Series DAQ Overview
Measurements
Self-Calibration Using an Internal Reference
The E Series analog inputs and outputs have calibration circuitry to
correct gain and offset errors. You can calibrate the device in
software to avoid analog I/O errors caused by time and temperature
drift at run time. No external circuitry is necessary; an internal
reference ensures high accuracy and stability over time and
temperature. Factory-calibration constants are permanently stored
in an onboard EEPROM and cannot be modified. A modifiable
section of the EEPROM stores user-modifiable constants. You can
return the devices to their initial factory calibration by accessing the
unmodified factory constants. Included with all E Series devices is
an NIST-traceable and ISO-9002 certified calibration certificate. Visit
ni.com/calibration for more information.
I/O Interface – MITE and DAQ-PnP
All of the PCI and PXI E Series use the MITE ASIC as a bus master
interface to the PCI bus. The E Series products for ISA use an ASIC
that fully implements the Plug and Play ISA Specification, so that the
DMA level, interrupt channels, and base I/O address are all software
configurable. All other E Series devices are inherently Plug and Play
compatible. Visit ni.com/info and enter exniev to download
a technical paper on bus mastering.
RTSI Bus Interface
All E Series devices except DAQCards, USB DAQPads, and PXI
modules are interfaced to the National Instruments RTSI bus with
an embedded cross-matrix switch in the DAQ-STC. This switch
synchronizes several DAQ devices by sending timing signals to
them on the RTSI bus. Using RTSI bus, a single master device can
control one or more slave devices for both single and multiple A/D
conversions. The PXI Trigger bus serves the same purpose for PXI
systems as RTSI bus.
E Series Multifunction DAQ Software
NI-DAQ
NI-DAQ, our driver software bundled with every E Series multifunction
DAQ device, provides access to the features of your DAQ hardware,
so that you can easily develop powerful measurement solutions.
You can use NI-DAQ to perform single-point and buffered
analog I/O, digital I/O, and counter/timer input operations. You can
perform those operations individually, or program your device to
perform multiple operations simultaneously. To facilitate integration
of signal conditioning in your system, NI-DAQ provides you with a
single interface for programming both the E Series device and signal
conditioning modules. Using NI-DAQ, you can also synchronize your
E Series multifunction DAQ device with other measurement devices,
to build measurement systems customized to your particular needs.
Measurement & Automation Explorer
NI Measurement & Automation Explorer (MAX) software, which is
bundled with every E Series multifunction DAQ device, guides you
through hardware configuration, channel scaling, and sensor set-up.
You can also test the basic operation of your E Series device and
signal connections using a test panel.
What About Signal Conditioning?
Signal conditioning is one of the most
important, and most overlooked,
components of a data acquisition system.
Many sensors require special signal
conditioning technology, and no DAQ
device has the capability to provide all
types of signal conditioning to all
sensors. Using NI signal conditioning
products, you can measure a wide variety
of signals and sensors. These modular
conditioning devices come in a range of
sizes, from rack-mountable SCXI systems
to portable SCC systems.
See page 383 for more information
on Signal Conditioning,
1
Not available on AT-AI-16XE-10, PCI-6032E,
DAQCard-A1-16E-4, DAQCard-A1-16XE-50
FREQ_OUT
GPCTR0_OUT
PFI9/GPCTR0_GATE
DGND
PFI6/WFTRIG
PFI5/UPDATE*
DGND
+5 V
DGND
PFI1/TRIG2
PFI0/TRIG1
DGND
DGND
+5 V
DGND
DIO6
DIO1
DGND
DIO4
EXTREF
1
DAC1OUT
1
DAC0OUT
1
ACH15
AIGND
ACH6
ACH13
AIGND
ACH4
AIGND
ACH3
ACH10
AIGND
ACH1
ACH8
DGND
PFI8/GPCTR0_SOURCE
PFI7/STARTSCAN
GPCTR1_OUT
PFI4/GPCTR1_GATE
PFI3/GPCTR1_SOURCE
PFI2/CONVERT*
DGND
DGND
DGND
EXTSTROBE*
SCANCLK
DIO3
DIO7
DIO2
DGND
DIO5
DIO0
DGND
AOGND
1
AOGND
1
AIGND
ACH7
ACH14
AIGND
ACH5
ACH12
AISENSE
ACH11
AIGND
ACH2
ACH9
AIGND
ACH0
135
236
337
438
539
640
741
842
943
10 44
11 45
12 46
13 47
14 48
15 49
16 50
17 51
18 52
19 53
20 54
21 55
22 56
23 57
24 58
25 59
26 60
27 61
28 62
29 63
30 64
31 65
32 66
33 67
34 68
AIGND
AIGND
ACH0
ACH8
ACH1
ACH9
ACH2
ACH10
ACH3
ACH11
ACH4
ACH12
ACH5
ACH13
ACH6
ACH14
ACH7
ACH15
AISENSE
DAC0OUT
DAC1OUT
RESERVED
AOGND
DGND
DIO0
DIO4
DIO1
DIO5
DIO2
DIO6
DIO3
DIO7
DGND
+5 V
+5 V
SCANCLK
EXTSTROBE*
PFI0/TRIG1
PFI1/TRIG2
PFI2/CONVERT*
PFI3/GPCTR1_SOURCE
PFI4/GPCTR1_GATE
GPCTR1_OUT
PFI5/UPDATE*
PFI6/WFTRIG
PFI7/STARTSCAN
GPCTR0_SOURCE
GPCTR0_GATE
GPCTR0_OUT
FREQ_OUT
PC7
GND
PC6
GND
PC5
GND
PC4
GND
PC3
GND
PC2
GND
PC1
GND
PC0
GND
PB7
GND
PB6
GND
PB5
GND
PB4
GND
PB3
GND
PB2
GND
PB1
GND
PB0
GND
PA7
GND
PA6
GND
PA5
GND
PA4
GND
PA3
GND
PA2
GND
PA1
GND
PA0
GND
+5 V
GND
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
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31
32
33
34
35
36
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60
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64
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100
Figure 3. 68-Pin I/O Connector for NI 6070E,
NI 6060E, NI 6062E, NI 6052E, NI 6041E,
NI 6040E, NI 6036E, NI 6035E, NI 6034E,
NI 6032E, NI 6030E, NI 6024E, NI 6023E,
NI 6020E, NI 6012E and NI 6011E Devices
Figure 4. 100-Pin I/O Connector for
NI 6021E and NI 6025E Devices
Figure 2. 100-Pin I/O Connector for NI 6071E,
NI 6061E, NI 6031E, NI 6033E Devices
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